With a wide range of techniques available, it is recommended that contact is made prior to submitting samples to discuss the most appropriate techniques and any sample handling or preparation requirements.
Techniques Available
Scanning Electron Microscopy (SEM) -
FEI Nova Nano SEM - Ultra High Resolution
FEI Inspect S - High Resolution
Atomic Force Microscopy (AFM) – Veeco Explorer LS
Confocal Scanning Laser Microscopy – Leica TCS SP
X-Ray µCT scanning