Our Scanning Electron Microscope (SEM) capabilities allow ultra high resolution (1nm) images of a sample surface. Thanks to variable pressure facilities, non-conducting samples can also be imaged at ultra high resolution without the need for a metal coating. SEM images are useful for judging the surface structure of the sample.

The SEM can also be used to analyse the spatial distribution of different chemical elements across the sample

Ultra-high resolution at variable pressure and high vacuum conditions

Cryo-stage

X-ray microanalysis (ED-X)

Backscatter detector for Atomic number information